Consistent model for short-channel nMOSFET after hard gate...

Consistent model for short-channel nMOSFET after hard gate oxide breakdown

Kaczer, B., Degraeve, R., De Keersgieter, A., Van de Mieroop, K., Simons, V., Groeseneken, G.
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Volume:
49
Year:
2002
Language:
english
Pages:
7
DOI:
10.1109/16.987123
File:
PDF, 197 KB
english, 2002
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