Wide-band characterization of multilayer thick film...

IEEE Transactions on Instrumentation and Measurement 1989 Vol. 38; Iss. 2

Wide-band characterization of multilayer thick film structures using a time-domain technique

Toscano, J.C., Elshabini-Riad, A., Riad, S.M., Al-Mazroo, A.Y.
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Volume:
38
Year:
1989
Language:
english
Pages:
6
DOI:
10.1109/19.192337
File:
PDF, 474 KB
english, 1989
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