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Tracing the complex RE reflection coefficient in the MHz range back to DC resistance standards by utilizing planar NiCr thin-film resistors
Stumper, U., Grno, L., Janik, D., Peinelt, W., Weimman, T.Volume:
42
Year:
1993
Language:
english
Pages:
5
DOI:
10.1109/19.278580
File:
PDF, 414 KB
english, 1993