Testing an ADC linearized with pseudorandom dither

IEEE Transactions on Instrumentation and Measurement 1998 Vol. 47; Iss. 4

Testing an ADC linearized with pseudorandom dither

Babu, B.N.S., Wollman, H.B.
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Volume:
47
Year:
1998
Language:
english
Pages:
10
DOI:
10.1109/19.744631
File:
PDF, 203 KB
english, 1998
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