Surface layer impurities on silicon spheres used in...

IEEE Transactions on Instrumentation and Measurement 1999 Vol. 48; Iss. 2

Surface layer impurities on silicon spheres used in determination of the Avogadro constant

Kenny, M.J., Netterfield, R.P., Wielunski, L.S., Beaglehole, D.
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Volume:
48
Year:
1999
Language:
english
Pages:
5
DOI:
10.1109/19.769571
File:
PDF, 109 KB
english, 1999
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