Measuring mixed-signal substrate coupling

IEEE Transactions on Instrumentation and Measurement 2001 Vol. 50; Iss. 4

Measuring mixed-signal substrate coupling

Rolain, Y., Van Moer, W., Vandersteen, G., van Heijningen, M.
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Volume:
50
Year:
2001
Language:
english
Pages:
6
DOI:
10.1109/19.948307
File:
PDF, 180 KB
english, 2001
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