Scanning electron microscopy with polarization analysis...

IEEE Transactions on Magnetics 1989 Vol. 25; Iss. 5

Scanning electron microscopy with polarization analysis studies of Ni-Fe magnetic memory elements

Unguris, J., Scheinfein, M.R., Celotta, R.J., Pierce, D.T.
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Volume:
25
Year:
1989
Language:
english
Pages:
3
DOI:
10.1109/20.42569
File:
PDF, 518 KB
english, 1989
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