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Microstructural characterization of YBa2Cu3O 7-δ thin films on SrTiO3 using four-axis X-ray diffraction
Sizemore, J., Barton, R., Marshall, A., Bravman, J.C., Naito, M., Char, K.Volume:
25
Year:
1989
Language:
english
Pages:
5
DOI:
10.1109/20.92850
File:
PDF, 569 KB
english, 1989