On testing of sequential machines using circuit...

IEEE Transactions on Systems Man and Cybernetics 1995 Vol. 25; Iss. 3

On testing of sequential machines using circuit decomposition and stochastic modeling

Das, S.R., Wen-Ben Jone, Nayak, A.R., Choi, I.
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Volume:
25
Year:
1995
Language:
english
Pages:
16
DOI:
10.1109/21.364861
File:
PDF, 1.36 MB
english, 1995
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