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Extracting a bias-dependent large signal MESFET model from pulsed I/V measurements
Fernandez, T., Newport, Y., Zamanillo, J.M., Tazon, A., Mediavilla, A.Volume:
44
Year:
1996
Language:
english
Pages:
7
DOI:
10.1109/22.486146
File:
PDF, 756 KB
english, 1996