Investigation and modeling of impact ionization with regard...

IEEE Transactions on Microwave Theory and Techniques 1997 Vol. 45; Iss. 6

Investigation and modeling of impact ionization with regard to the RF and noise behavior of HFET

Reuter, R., Agethen, M., Auer, U., van Waasen, S., Peters, D., Brockerhoff, W., Tegude, F.-J.
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Volume:
45
Year:
1997
Language:
english
Pages:
7
DOI:
10.1109/22.588612
File:
PDF, 262 KB
english, 1997
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