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Experimental evaluation of microwave field-effect-transistor noise models
Heymann, P., Rudolph, M., Prinzler, H., Doerner, R., Klapproth, L., Bock, G.Volume:
47
Year:
1999
Language:
english
Pages:
8
DOI:
10.1109/22.744290
File:
PDF, 355 KB
english, 1999