On RF material characterization in the stripline cavity

IEEE Transactions on Microwave Theory and Techniques 2000 Vol. 48; Iss. 2

On RF material characterization in the stripline cavity

Weil, C.M., Jones, C.A., Kantur, Y., Grosvenor, J.H., Jr.
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Volume:
48
Year:
2000
Language:
english
Pages:
10
DOI:
10.1109/22.821774
File:
PDF, 199 KB
english, 2000
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