Temperature-dependent dose rate effects in CMOS/SOS devices

IEEE Transactions on Nuclear Science 1994 Vol. 41; Iss. 5

Temperature-dependent dose rate effects in CMOS/SOS devices

Seidler, W., Walters, D., Florian, J., Harper, H., Lutjens, S., Salazar, M., Alexander, D., Smith, A., Heideman, B., Self, T., Ferguson, G., Ovrebo, G., Blomquist, S., Blackburn, J., Vanderwall, J.
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Volume:
41
Year:
1994
Language:
english
Pages:
10
DOI:
10.1109/23.317388
File:
PDF, 1024 KB
english, 1994
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