Universal built-in self-test procedure for CMOS PLA's

Universal built-in self-test procedure for CMOS PLA's

Ortega, J., Prieto, A., Lloris, A., Pelayo, F.
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Volume:
38
Year:
1991
Language:
english
Pages:
5
DOI:
10.1109/31.85635
File:
PDF, 475 KB
english, 1991
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