A study of ESD protection devices for input pins. Discharge characteristics of diode, lateral bipolar transistor, and thyristor under MM and HBM tests
Ishizuka, H., Okuyama, K., Kubota, K., Komuro, M., Hara, Yu.Volume:
21
Year:
1998
Language:
english
Pages:
8
DOI:
10.1109/3476.739170
File:
PDF, 613 KB
english, 1998