Measurement of Internal Electric Field in GaN-Based...

Measurement of Internal Electric Field in GaN-Based Light-Emitting Diodes

Su-Ik Park, Jong-Ik Lee, Dong-Hyun Jang, Hyun-Sung Kim, Dong-Soo Shin, Han-Youl Ryu, Jong-In Shim
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Volume:
48
Year:
2012
Language:
english
Pages:
7
DOI:
10.1109/jqe.2012.2186610
File:
PDF, 947 KB
english, 2012
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