Highly Reliable Depletion-Mode a-IGZO TFT Gate Driver...

IEEE Electron Device Letters 2012 Vol. 33; Iss. 4

Highly Reliable Depletion-Mode a-IGZO TFT Gate Driver Circuits for High-Frequency Display Applications Under Light Illumination

Kim, B., Hyung Nyuck Cho, Woo Seok Choi, Seung-Hee Kuk, Yong Ho Jang, Juhn-Suk Yoo, Soo Young Yoon, Myungchul Jun, Yong-Kee Hwang, Min-Koo Han
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Volume:
33
Year:
2012
Language:
english
Pages:
3
DOI:
10.1109/led.2011.2181969
File:
PDF, 635 KB
english, 2012
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