Rapid Prediction of RRAM RESET-State Disturb by Ramped...

IEEE Electron Device Letters 2012 Vol. 33; Iss. 4

Rapid Prediction of RRAM RESET-State Disturb by Ramped Voltage Stress

Wun-Cheng Luo, Kuan-Liang Lin, Jiun-Jia Huang, Chung-Lun Lee, Tuo-Hung Hou
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Volume:
33
Year:
2012
Language:
english
Pages:
3
DOI:
10.1109/led.2012.2185838
File:
PDF, 367 KB
english, 2012
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