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Simulation Study of Dominant Statistical Variability Sources in 32-nm High- /Metal Gate CMOS
Xingsheng Wang, Roy, G., Saxod, O., Bajolet, A., Juge, A., Asenov, A.Volume:
33
Year:
2012
Language:
english
Pages:
3
DOI:
10.1109/led.2012.2188268
File:
PDF, 271 KB
english, 2012