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Scaling to the end of silicon with EDGE architectures
Burger, D., Keckler, S.W., McKinley, K.S., Dahlin, M., John, L.K., Lin, C., Moore, C.R., Burrill, J., McDonald, R.G., Yoder, W.Volume:
37
Year:
2004
Language:
english
Pages:
12
DOI:
10.1109/mc.2004.65
File:
PDF, 227 KB
english, 2004