The end of CMOS scaling: toward the introduction of new...

IEEE Circuits and Devices Magazine 2005 Vol. 21; Iss. 1

The end of CMOS scaling: toward the introduction of new materials and structural changes to improve MOSFET performance

Skotnicki, T., Hutchby, J.A., Tsu-Jae King, Wong, H.-S.P., Boeuf, F.
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Volume:
21
Year:
2005
Language:
english
Pages:
11
DOI:
10.1109/mcd.2005.1388765
File:
PDF, 1.65 MB
english, 2005
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