Thermal noise in junction-gate field-effect transistors

IEEE Transactions on Electron Devices 1966 Vol. 13; Iss. 3

Thermal noise in junction-gate field-effect transistors

Bruncke, W.C., van der Ziel, A.
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Volume:
13
Year:
1966
Language:
english
Pages:
7
DOI:
10.1109/t-ed.1966.15688
File:
PDF, 624 KB
english, 1966
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