Avalanche breakdown of diffused junctions in silicon...

IEEE Transactions on Electron Devices 1966 Vol. 13; Iss. 3

Avalanche breakdown of diffused junctions in silicon epitaxial layers

Breitschwerdt, K.G.
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Volume:
13
Year:
1966
Language:
english
Pages:
3
DOI:
10.1109/t-ed.1966.15699
File:
PDF, 377 KB
english, 1966
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