Field-dependent mobility effects in the excess noise of...

IEEE Transactions on Electron Devices 1967 Vol. 14; Iss. 2

Field-dependent mobility effects in the excess noise of junction-gate field-effect transistors

Halladay, H.E., van der Ziel, A.
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Volume:
14
Year:
1967
Language:
english
Pages:
2
DOI:
10.1109/t-ed.1967.15908
File:
PDF, 217 KB
english, 1967
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