Electron irradiation induced recombination centers in...

Electron irradiation induced recombination centers in silicon-minority carrier lifetime control

Rai-Choudhury, P., Bartko, J., Johnson, J.E.
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Volume:
23
Year:
1976
Language:
english
Pages:
5
DOI:
10.1109/t-ed.1976.18491
File:
PDF, 580 KB
english, 1976
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