Reliability of power GaAs field-effect transistors
Fukui, H., Wemple, S.H., Irvin, J.C., Niehaus, W.C., Hwang, J.C.M., Cox, H.M., Schlosser, W.O., DiLorenzo, J.V.Volume:
29
Year:
1982
Language:
english
Pages:
7
DOI:
10.1109/t-ed.1982.20714
File:
PDF, 875 KB
english, 1982