Lucky-electron model of channel hot-electron injection in...

IEEE Transactions on Electron Devices 1984 Vol. 31; Iss. 9

Lucky-electron model of channel hot-electron injection in MOSFET'S

Simon Tam, Ping-Keung Ko, Chenming Hu
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Volume:
31
Year:
1984
Language:
english
Pages:
10
DOI:
10.1109/t-ed.1984.21674
File:
PDF, 956 KB
english, 1984
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