High-temperature physical effects underlying the failure...

IEEE Transactions on Electron Devices 1984 Vol. 31; Iss. 9

High-temperature physical effects underlying the failure mechanism in thyristors under surge conditions

Silard, A.P.
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Volume:
31
Year:
1984
Language:
english
Pages:
7
DOI:
10.1109/t-ed.1984.21709
File:
PDF, 863 KB
english, 1984
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