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Mobility degradation in very thin Oxide p-channel MOSFET's
Hao-Quan Su, Che-Chia Wei, Tso-Ping MaVolume:
32
Year:
1985
Language:
english
Pages:
3
DOI:
10.1109/t-ed.1985.21977
File:
PDF, 367 KB
english, 1985