IIA-3 cryogenic noise performance of quarter-micrometer...

IEEE Transactions on Electron Devices 1985 Vol. 32; Iss. 11

IIA-3 cryogenic noise performance of quarter-micrometer gate-length high-electron-mobility transistors

Chao, P.C., Smith, P.M., Mishra, U.K., Palmateer, S.C., Hwang, J.C.M., Pospieszalski, M., Brooks, T., Weinreb, S.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
32
Year:
1985
Language:
english
Pages:
1
DOI:
10.1109/t-ed.1985.22309
File:
PDF, 170 KB
english, 1985
Conversion to is in progress
Conversion to is failed