Noise modeling in submicrometer-gate two-dimensional...

IEEE Transactions on Electron Devices 1985 Vol. 32; Iss. 12

Noise modeling in submicrometer-gate two-dimensional electron-gas field-effect transistors

Cappy, A., Vanoverschelde, A., Schortgen, M., Versnaeyen, C., Salmer, G.
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Volume:
32
Year:
1985
Language:
english
Pages:
10
DOI:
10.1109/t-ed.1985.22417
File:
PDF, 1.01 MB
english, 1985
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