A new structure-oriented model for well resistance in CMOS...

IEEE Transactions on Electron Devices 1987 Vol. 34; Iss. 4

A new structure-oriented model for well resistance in CMOS latchup structures

Ming-Jer Chen, Song-Cheng Sze, Hsing-Hai Chen, Ching-Yuan Wu
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Volume:
34
Year:
1987
Language:
english
Pages:
8
DOI:
10.1109/t-ed.1987.23012
File:
PDF, 714 KB
english, 1987
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