Latchup performance of retrograde and conventional n-well...

IEEE Transactions on Electron Devices 1987 Vol. 34; Iss. 10

Latchup performance of retrograde and conventional n-well CMOS technologies

Lewis, A.G., Martin, R.A., Tiao-Yuan Huang, Chen, J.Y., Koyanagi, M.
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Volume:
34
Year:
1987
Language:
english
Pages:
9
DOI:
10.1109/t-ed.1987.23211
File:
PDF, 973 KB
english, 1987
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