Measurement and numerical modeling of short-channel MOSFET...

Measurement and numerical modeling of short-channel MOSFET gate capacitances

Yew-Tong Yeow
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Volume:
34
Year:
1987
Language:
english
Pages:
11
DOI:
10.1109/t-ed.1987.23342
File:
PDF, 1.04 MB
english, 1987
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