In vivo measurement of the brain and skull resistivities using an EIT-based method and the combined analysis of SEF/SEP data
Goncalve, S., de Munck, J.C., Verbunt, J.P.A., Heethaar, R.M., da Silva, F.H.L.Volume:
50
Year:
2003
Language:
english
Pages:
5
DOI:
10.1109/tbme.2003.816072
File:
PDF, 268 KB
english, 2003