Efficient Trace Signal Selection for Silicon Debug by Error...

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 2012 Vol. 31; Iss. 3

Efficient Trace Signal Selection for Silicon Debug by Error Transmission Analysis

Joon-Sung Yang, Touba, N.A.
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Volume:
31
Year:
2012
Language:
english
Pages:
5
DOI:
10.1109/tcad.2011.2171184
File:
PDF, 1.15 MB
english, 2012
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