"Ramp Differentiation" C(V) Measurement of MOS...

IEEE Transactions on Education 1971 Vol. 14; Iss. 2

"Ramp Differentiation" C(V) Measurement of MOS Structures for Thermally Grown Oxide Quality Analysis

Mitchell, Cheryl Kaufman, Schmitz, Ronald J.
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Volume:
14
Year:
1971
Language:
english
Pages:
2
DOI:
10.1109/te.1971.4320657
File:
PDF, 298 KB
english, 1971
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