The study of threshold voltage extraction of nitride spacer...

The study of threshold voltage extraction of nitride spacer NMOS transistors in early stage hot carrier stress

Jun-Lin Tsai, Kai-Ye Huang, Jinn-Horng Lai, Jeng Gong, Fu-Jei Yang, Sun-Yun Lin
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Volume:
49
Year:
2002
Language:
english
Pages:
3
DOI:
10.1109/ted.2002.801438
File:
PDF, 230 KB
english, 2002
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