Hot-carrier-induced degradation in short p-channel...

IEEE Transactions on Electron Devices 2002 Vol. 49; Iss. 9

Hot-carrier-induced degradation in short p-channel nonhydrogenated polysilicon thin-film transistors

Hastas, N.A., Dimitriadis, C.A., Brini, J., Kamarinos, G.
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Volume:
49
Year:
2002
Language:
english
Pages:
6
DOI:
10.1109/ted.2002.802622
File:
PDF, 275 KB
english, 2002
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