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An updated temperature-dependent breakdown coupling model including both impact ionization and tunneling mechanisms for AlGaAs/InGaAs HEMTs
Li, H.P., Hartin, O.L., Ray, M.Volume:
49
Year:
2002
Language:
english
Pages:
4
DOI:
10.1109/ted.2002.802651
File:
PDF, 275 KB
english, 2002