A methodology to extract the channel current of permeable...

IEEE Transactions on Electron Devices 2003 Vol. 50; Iss. 5

A methodology to extract the channel current of permeable gate oxide MOSFETs

Palestri, P., Esseni, D., Selmi, L., Guegan, G., Sangiorgi, E.
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Volume:
50
Year:
2003
Language:
english
Pages:
8
DOI:
10.1109/ted.2003.813245
File:
PDF, 611 KB
english, 2003
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