A new extrapolation method for long-term degradation...

IEEE Transactions on Electron Devices 2003 Vol. 50; Iss. 5

A new extrapolation method for long-term degradation prediction of deep-submicron MOSFETs

Zhi Cui, Liou, J.J., Yue, Y.
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Volume:
50
Year:
2003
Language:
english
Pages:
4
DOI:
10.1109/ted.2003.813473
File:
PDF, 262 KB
english, 2003
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