Failure analysis of 6T SRAM on low-voltage and...

IEEE Transactions on Electron Devices 2003 Vol. 50; Iss. 5

Failure analysis of 6T SRAM on low-voltage and high-frequency operation

Ikeda, S., Yoshida, Y., Ishibashi, K., Mitsui, Y.
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Volume:
50
Year:
2003
Language:
english
Pages:
7
DOI:
10.1109/ted.2003.813474
File:
PDF, 1.30 MB
english, 2003
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