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Characteristics of low-leakage deep-trench diode for ESD protection design in 0.18-μm SiGe BiCMOS process
Shiao-Shien Chen, Tung-Yang Chen, Tien-Hao Tang, Jin-Lian Su, Tzer-Min Shen, Jen-Kon ChenVolume:
50
Year:
2003
Language:
english
Pages:
7
DOI:
10.1109/ted.2003.814971
File:
PDF, 604 KB
english, 2003