Trends in the ultimate breakdown strength of high...

IEEE Transactions on Electron Devices 2003 Vol. 50; Iss. 8

Trends in the ultimate breakdown strength of high dielectric-constant materials

McPherson, J.W., Jinyoung Kim, Shanware, A., Mogul, H., Rodriguez, J.
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Volume:
50
Year:
2003
Language:
english
Pages:
8
DOI:
10.1109/ted.2003.815141
File:
PDF, 760 KB
english, 2003
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