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Current mismatch due to local dopant fluctuations in MOSFET channel
Hongning Yang, Macary, V., Huber, J.L., Won-Gi Min, Baird, B., Jiangkai ZuoVolume:
50
Year:
2003
Language:
english
Pages:
7
DOI:
10.1109/ted.2003.818282
File:
PDF, 619 KB
english, 2003