1/f noise in Si and Si0.7Ge0.3 pMOSFETs

IEEE Transactions on Electron Devices 2003 Vol. 50; Iss. 12

1/f noise in Si and Si0.7Ge0.3 pMOSFETs

von Haartman, M., Lindgren, A.C., Hellstrom, P.E., Malm, B.G., Shi-Li Zhang, Ostling, M.
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Volume:
50
Year:
2003
Language:
english
Pages:
7
DOI:
10.1109/ted.2003.819258
File:
PDF, 455 KB
english, 2003
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