Influence of interface traps and surface mobility degradation on scanning capacitance microscopy measurement
Hong, Y.D., Yew Tong Yeow, Chim, W.-K., Kin-Mun Wong, Kopanski, J.J.Volume:
51
Year:
2004
Language:
english
Pages:
8
DOI:
10.1109/ted.2004.833590
File:
PDF, 649 KB
english, 2004