Moving current filaments in integrated DMOS transistors...

IEEE Transactions on Electron Devices 2004 Vol. 51; Iss. 10

Moving current filaments in integrated DMOS transistors under short-duration current stress

Denison, M., Blaho, M., Rodin, P., Dubec, V., Pogany, D., Silber, D., Gornik, E., Stecher, M.
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Volume:
51
Year:
2004
Language:
english
Pages:
9
DOI:
10.1109/ted.2004.835978
File:
PDF, 1.95 MB
english, 2004
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